Fault coverage-based test suite optimization method for regression testing: learning from mistakes-based approach
Agrawal, Arun Prakash ; Choudhary, Ankur ; Kaur, Arvinder ; Pandey, Hari Mohan
- Link zu diesem Datensatz
- https://d-nb.info/1181634563
- Titel
- Fault coverage-based test suite optimization method for regression testing: learning from mistakes-based approach
- Art des Inhalts
- Teil eines Werks
- Verfassangaben
- by Arun Prakash Agrawal, Ankur Choudhary, Arvinder Kaur, Hari Mohan Pandey
- Autor(en)
-
- Agrawal, Arun Prakash
- Choudhary, Ankur
- Kaur, Arvinder
- Pandey, Hari Mohan
- Organisation(en)
-
- SpringerLink (Online service)
- Zeitliche Einordnung
- Erscheinungsdatum: 2019
- Umfang/Format
- Online-Ressource
- ISSN
14333058- DOI
- 10.1007/s00521-019-04098-9
- Online
- https://doi.org/10.1007/s00521-019-04098-9
- Sprache
- eng
- Schlagwörter
-
- (lcsh)Mathematical statistics.
- (lcsh)Data mining.
- (lcsh)Image processing.
- (lcsh)Bioinformatics.
- (lcsh)Computer mathematics.
- Artificial Intelligence.
- Data Mining and Knowledge Discovery.
- Probability and Statistics in Computer Science.
- Computational Science and Engineering.
- Image Processing and Computer Vision.
- Computational Biology/Bioinformatics.
- Frühere/spätere Titel
-
- Enthalten in: Neural computing & applications
- Enthalten in: Neural computing & applications
- Enthalten in: Neural computing & applications
- Stand
- 17.12.2025 08:23
- Im Katalog seit
- 07.03.2026