An efficient prediction framework for multi-parametric yield analysis under parameter variations
Li, Xin ; Sun, Jin ; Xiao, Fu
- Link zu diesem Datensatz
- https://d-nb.info/1123542856
- Titel
- An efficient prediction framework for multi-parametric yield analysis under parameter variations
- Art des Inhalts
- Teil eines Werks
- Verfassangaben
- by Xin Li, Jin Sun, Fu Xiao
- Autor(en)
-
- Li, Xin
- Sun, Jin
- Xiao, Fu
- Organisation(en)
-
- SpringerLink (Online service)
- Zeitliche Einordnung
- Erscheinungsdatum: 2016
- Umfang/Format
- Online-Ressource
- ISSN
20959230- DOI
- 10.1631/FITEE.1601225
- Online
- https://doi.org/10.1631/FITEE.1601225
- Sprache
- eng
- DDC-Klasse(n)
- Schlagwörter
-
- (lcsh)Computer science.
- (lcsh)Computer hardware.
- (lcsh)Computer organization.
- (lcsh)Electrical engineering.
- (lcsh)Electronics.
- (lcsh)Microelectronics.
- Computer Science.
- Computer Science, general.
- Electrical Engineering.
- Computer Hardware.
- Computer Systems Organization and Communication Networks.
- Electronics and Microelectronics, Instrumentation.
- Communications Engineering, Networks.
- Frühere/spätere Titel
-
- Enthalten in: Frontiers of information technology & electronic engineering
- Enthalten in: Frontiers of information technology & electronic engineering
- Enthalten in: Frontiers of information technology & electronic engineering
- Stand
- 17.01.2017 02:31
- Im Katalog seit
- 06.03.2026