„metrology“

Suchergebnisse

1.000+ Treffer

• Kinetics of Duplex Oxide Growth on 9Cr Steels Exposed in CO2: Application of Dimensional Metrology
  Sumner, Joy ; Simms, Nigel ; Shin, Aya ; Pearson, Jonathan
• A robust and automated FE-based method for fixtureless dimensional metrology of non-rigid parts using an improved numerical inspection fixture
  Sabri, V. ; Sattarpanah, S. ; Tahan, S. A. ; Cuillière, J. C. ; François, V. ; Pham, X. T.
• A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system
  Chen, Zhehan
• Experimental validation and characterization of a real-time metrology system for photopolymerization-based stereolithographic additive manufacturing process
  Zhao, Xiayun ; Rosen, David W.
• Moving towards in-line metrology: evaluation of a Laser Radar system for in-line dimensional inspection for automotive assembly systems
  Kiraci, Ercihan ; Franciosa, Pasquale ; Turley, Glen A. ; Olifent, Alan ; Attridge, Alex ; Williams, Mark A.
• Investigating surface metrology of curved wall surface during milling of SS304 with different tool path strategies
  Brooks, Zachary ; Nath, Chandra ; Kurfess, Thomas R.
• Verification of a laser tracker with an indexed metrology platform
  Acero, R. ; Santolaria, J. ; Pueo, M. ; Brau, A.
• Photonic Metrology with Hierarchic Quantum Frequentist Bounds
  Liu, Xin‐Zhu ; Yang, Yan‐Han ; Gessner, Manuel ; Smerzi, Augusto ; Li, Weidong ; Yang, Xue ; Luo, Ming‐Xing
• Back Cover: Critical Quantum Metrology in a Stabilized Two‐Photon Rabi Model (Adv. Quantum Technol. 11/2025)
  Ying, Zu‐Jian ; Han, Hang‐Hang ; Li, Bo‐Jian ; Felicetti, Simone ; Braak, Daniel
• Inverted PAINT for Material‐Specific Super‐Resolution Fluorescence Imaging of Semiconductors (Adv. Mater. 44/2025)
  Jeong, Uidon ; Kim, Doory
• Serrodyne‐Enabled Dual Electro‐Optic Comb Interferometry for High‐Precision Absolute Ranging and Integration‐Ready Metrology (Adv. Sci. 37/2025)
  Guo, Xiaoyang ; Yang, Xusheng ; Zhi, Jiawen ; Shao, Chenggang ; Wu, Hanzhong
• Combining Squeezing and Transition Sensitivity Resources for Quantum Metrology by Asymmetric Non‐Linear Rabi Model (Adv. Quantum Technol. 7/2025)
  Ying, Zu‐Jian
• The Effect of Relative Humidity in Conductive Atomic Force Microscopy (Adv. Mater. 51/2024)
  Yuan, Yue ; Lanza, Mario
• Metrology of Platinum Nanozymes: Mechanistic Insights and Analytical Issues (Adv. Funct. Mater. 24/2024)
  Cursi, Lorenzo ; Mirra, Giulia ; Boselli, Luca ; Pompa, Pier Paolo
• Ferroelectric HfO 2 thin film testing and whole wafer mapping with non‐contact corona‐Kelvin metrology (Phys. Status Solidi A 7∕2017)
  Marinskiy, Dmitriy ; Polakowski, Patrick ; Edelman, Piotr ; Wilson, Marshall ; Lagowski, Jacek ; Metzger, Joachim ; Binder, Robert ; Müller, Johannes
• Quality system implementation in the National Metrology Institute of Montenegro
  Asanovic, Vanja ; Raonic, Milena ; Cuturic-Knezevic, Naina ; Vukoslavovic, Goran ; Popovic, Milena ; Jestrovic, Vladan
• Ultra‐Large Scale Stitchless AFM: Advancing Nanoscale Characterization and Manipulation with Zero Stitching Error and High Throughput (Small 1/2024)
  Liu, Yijie ; Li, Xuexuan ; Zhang, Yuliang ; Ge, Lin ; Guan, Yingchun ; Zhang, Zhen
• Metrology of Individual Small Viruses (Adv. Mater. Interfaces 33/2023)
  Li, Kun ; Shah, Arjav ; Sharma, Rajesh Kumar ; Adkins, Raymond ; Marjanovic, Tihomir ; Doyle, Patrick S. ; Garaj, Slaven
• High Resolution Surface Metrology Using Microsphere‐Assisted Interference Microscopy (Phys. Status Solidi A 13∕2019)
  Montgomery, Paul C. ; Lecler, Sylvain ; Leong‐Hoï, Audrey ; Perrin, Stéphane
• Buckling 2D Materials: Revisiting the Buckling Metrology Method to Determine the Young's Modulus of 2D Materials (Adv. Mater. 10/2019)
  Iguiñiz, Nestor ; Frisenda, Riccardo ; Bratschitsch, Rudolf ; Castellanos‐Gomez, Andres