„electron diffraction“

Suchergebnisse

2.848 Treffer

• Biosynthesis and characterization of Au‐nanostructures by metal tolerant fungi
  Gupta, Saurabh ; Devi, Sunita ; Singh, Karamjit
• Innovative Measurement Techniques in Surface Science
  Freund, Hans‐Joachim ; Nilius, Niklas ; Risse, Thomas ; Schauermann, Swetlana ; Schmidt, Thomas
• Synthesis and characterization of inorganic‐organic ZnS (aminopropane) n composite materials
  Luberda‐Durnaś, K. ; Gaweł, B. ; Łoś, M. ; Łasocha, W.
• Structural investigation and electronic band transitions of nanostructured TiO 2 thin films
  Sebnem Cetin, S. ; Corekci, S. ; Cakmak, M. ; Ozcelik, S.
• Pseudosymmetry in Trinitropyrazole: The Cost of Error in Space‐Group Determination †
  Nelyubina, Yulia V. ; Dalinger, Igor L. ; Lyssenko, Konstantin A.
• Structural analysis of potassium-doped calcium chromite (Ca 1− x K x Cr 2 O 4) nanoparticles synthesized by sol-gel method
  Siddiqui, Rabia ; Rani, Malika ; Shakoor, Abdul ; Atiq, Shahid ; Neffati, Riadh
• Microstructure Study of Electrochemically Driven Li x Si
  Son, Seoung‐Bum ; Trevey, James E. ; Roh, Hyunchul ; Kim, Sung‐Hwan ; Kim, Kee‐Bum ; Cho, Jong Soo ; Moon, Jeong‐Tak ; DeLuca, Christopher M. ; Maute, Kurt K. ; Dunn, Martin L. ; Han, Heung Nam ; Oh, Kyu Hwan ; Lee, Se‐Hee
• Growth and XRD analysis of the diluted magnetic semiconductor Zn 1‐x Ni x O
  Syed Ali, K. S. ; Saravanan, R. ; Açıkgöz, M.
• Precession Electron Diffraction – a versatile tool for the characterization of Phase Change Materials
  Schürmann, U. ; Duppel, V. ; Buller, S. ; Bensch, W. ; Kienle, L.
• A critical review of orientation microscopy in SEM and TEM
  Zaefferer, S.
• Automated electron diffraction tomography – a new tool for nano crystal structure analysis
  Kolb, U. ; Mugnaioli, E. ; Gorelik, T. E.
• Nano beam diffraction and precession in an energy filtered C S corrected transmission electron microscope
  Benner, G. ; Niebel, H. ; Pavia, G.
• High spatial resolution semi‐automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes
  Moeck, P. ; Rouvimov, S. ; Rauch, E. F. ; Véron, M. ; Kirmse, H. ; Häusler, I. ; Neumann, W. ; Bultreys, D. ; Maniette, Y. ; Nicolopoulos, S.
• From Sir2008 to Sir2011: the role of electron diffraction
  Camalli, M. ; Carrozzini, B. ; Cascarano, G. L. ; Giacovazzo, C.
• eMap and eSlice: a software package for crystallographic computing
  Oleynikov, P.
• In-Situ Electron Backscatter Diffraction Study of Deformation Behavior of Fine-grained Dual Phase Steel Subjected to Uniaxial Tension
  Nagarajan, Srinivasan ; Jain, Roopam ; Jha, Sumit ; Sahu, Vivek Kumar ; Gurao, N. P.
• Electron Backscattered Diffraction in the Study of Matrices for High-Level Wastes
  Yudintsev, S. V. ; Nickolsky, M. S. ; Stefanovskaya, O. I. ; Nikonov, B. S. ; Ulanova, A. S.
• Nucleation and Chemical Transformation of RuO 2 Films Grown on (100) Si Substrates by Atomic Layer Deposition †
  Salaün, Amelie ; Newcomb, Simon B. ; Povey, Ian M. ; Salaün, Mathieu ; Keeney, Lynette ; O'Mahony, Aileen ; Pemble, Martyn E.
• Development of Crystallographic Texture and In‐Grain Misorientation in CVD‐Produced Single and Polycrystalline Diamond †
  Mohapatra, Dipti Ranjan ; Jain, Lokendra ; Rai, Padmnabh ; Hazra, Kiran Shankar ; Samajdar, Indradev ; Misra, Devi Shanker
• Crystal Structures and Stabilities of γ‐ and γ′‐Brass Phases in Pd 2– x Au x Zn 11 (x = 0.2–0.8): Vacancies vs. Valence Electron Concentration
  Thimmaiah, Srinivasa ; Crumpton, Nicholas A. ; Miller, Gordon J.