„electron diffraction“

Suchergebnisse

2.848 Treffer

• Ordnungsvarianten in ternären Chalkogeniden mit aufgefüllter β‐Manganstruktur †
  Kienle, Lorenz ; Duppel, V. ; Simon, A. ; Deiseroth, H. J.
• X-ray diffraction from quantum wires and quantum dots
  Zhuang, Y. ; Stangl, J. ; Darhuber, A. A. ; Bauer, G. ; Mikuli´k, P. ; Holy´, V. ; Darowski, N. ; Pietsch, U.
• Characterization of strain relaxation of (0 0 1) oriented SrTiO3 thin films grown on LaAIO3 (1 1 0) by means of reciprocal space mapping using x-ray diffraction
  Edvardsson, C. N. L. ; Birch, J. ; Helmersson, U.
• X-ray diffraction reciprocal space and pole figure characterization of cubic GaN epitaxial layers grown on (0 0 1) GaAs by molecular beam epitaxy
  Qin, Zhixin ; Kobayashi, Masakazu ; Yoshikawa, Akihiko
• Study of the lattice strain relaxation in the Ga1-X Al X Sb/GaSb system by x-ray topography and high resolution diffraction
  Bocchi, C. ; Germini, F. ; Franchi, S. ; Baraldi, A. ; Gennari, S. ; Magnanini, R. ; Drigo, A. V.
• A Systematic Investigation on Diffraction Characteristics of Dielectric Periodic Structure with Arbitrary Grating Profiles
  Xu, Shanjia ; Li, Yang ; Yoneyama, T.
• Etched-Diffraction-Grating-Based Planar Waveguide Demultiplexer on Silicon-on-Insulator
  Wang, Wenhui ; Tang, Yanzhe ; Wang, Yunxiang ; Qu, Hongchang ; Wu, Yaming ; Li, Tie ; Yang, Jianyi ; Wang, Yuelin ; Liu, Ming
• Modelling of diffraction in pillar vertical cavity surface-emitting lasers with embedded Bragg layers
  Burton, R. R. ; Stern, M. S. ; Kendall, P. C. ; Robson, P. N.
• Triple junction distribution profiles as assessed by electron backscatter diffraction
  Davies, P. ; Randle, V. ; Watkins, G. ; Davies, H.
• Electron Diffraction Analysis of the Fracture Zone of Fe–0.45C–17Mn–3Al Steel Subjected to Multicyclic Fatigue Tests
  Popova, N. A. ; Sosnin, O. V. ; Ignatenko, L. N. ; Konovalov, S. V. ; Kovalenko, V. V. ; Ivanov, Yu. F. ; Gromov, V. E. ; Koneva, N. A.
• Controlled Conversion of Rays with Different Wavelengths Using Acousto-Optic Bragg Diffraction
  Kotov, V. M.
• Characterization of Selectively Doped InAs-Quantum-Dot GaAs-Based Multilayer Heterostructures by High-Resolution X-ray Diffraction
  Pashaev, E. M. ; Yakunin, S. N. ; Zaitsev, A. A. ; Mokerov, V. G. ; Fedorov, Yu. V. ; Imamov, R. M.
• Molecular Structure of Diphenylphosphine As Determined by Gas-Phase Electron Diffraction and Quantum-Chemical Calculations
  Naumov, V. A. ; Tafipol'skii, M. A. ; Naumov, A. V. ; Samdal, S.
• High‐Throughput Electron Diffraction Reveals a Hidden Novel Metal–Organic Framework for Electrocatalysis
  Ge, Meng ; Wang, Yanzhi ; Carraro, Francesco ; Liang, Weibin ; Roostaeinia, Morteza ; Siahrostami, Samira ; Proserpio, Davide M. ; Doonan, Christian ; Falcaro, Paolo ; Zheng, Haoquan ; Zou, Xiaodong ; Huang, Zhehao
• High‐Throughput Electron Diffraction Reveals a Hidden Novel Metal–Organic Framework for Electrocatalysis
  Ge, Meng ; Wang, Yanzhi ; Carraro, Francesco ; Liang, Weibin ; Roostaeinia, Morteza ; Siahrostami, Samira ; Proserpio, Davide M. ; Doonan, Christian ; Falcaro, Paolo ; Zheng, Haoquan ; Zou, Xiaodong ; Huang, Zhehao
• Weak Attractive Interactions between Methylthio Groups and Electron‐Deficient Alkenes in peri ‐Naphthalenes: A Competition with Conjugative Effects
  O'Leary, Jane ; Wallis, John D.
• Electron diffraction at stepped homogeneous and inhomogeneous surfaces
  Wollschläger, J. ; Falta, J. ; Henzler, M.
• Microwave‐Assisted Synthesis of Metallic Nanostructures in Solution
  Tsuji, Masaharu ; Hashimoto, Masayuki ; Nishizawa, Yuki ; Kubokawa, Masatoshi ; Tsuji, Takeshi
• Morphology and Structure of Crystalline Polysaccharides: Some Recent Studies
  Putaux, Jean‐Luc
• Entwicklung von neuen Materialien auf Cellulosebasis
  Vocht, Marc Philip 2022 Cuvillier Verlag