„electron diffraction“

Suchergebnisse

2.848 Treffer

• Unraveling the Microstructure of Layered Metal Halide Perovskite Films
  Duim, Herman ; ten Brink, Gert H. ; Adjokatse, Sampson ; de Kloe, René ; Kooi, Bart J. ; Portale, Giuseppe ; Loi, Maria Antonietta
• Requiem for gas-phase electron diffraction
  Hargittai, István ; Hargittai, Magdolna
• Structural Investigation of Graphitic Carbon Nitride
  Lotsch, Bettina V. ; Schnick, W. ; Döblinger, M. ; Seyfarth, L. ; Sehnert, J. ; Senker, J.
• A Comparative Study of (Cu–III–Se 2) x –(FeSe) 1—x Alloys (III: Al, Ga, In) (0 ≤ x ≤ 1) by X‐Ray Diffraction, Differential Thermal Analysis and Scanning Electron Microscopy
  Grima‐Gallardo, P. ; Cárdenas, K. ; Molina, L. ; Quintero, M. ; Ruiz, J. ; Delgado, G. ; Briceño, J.M.
• Electron Backscattered Diffraction Patterns from Cooled Gallium Nitride Thin Films
  Sweeney, F. ; Trager‐Cowan, C. ; Hastie, J. ; Cowan, D.A. ; O'donnell, K.P. ; Zubia, D. ; Hersee, S.D. ; Foxon, C.T. ; Harrison, I. ; Novikov, S.V.
• Investigation of Defects and Polarity in GaN Using Hot Wet Etching, Atomic Force and Transmission Electron Microscopy and Convergent Beam Electron Diffraction
  Visconti, P. ; Huang, D. ; Reshchikov, M.A. ; Yun, F. ; King, T. ; Baski, A.A. ; Cingolani, R. ; Litton, C.W. ; Jasinski, J. ; Liliental‐Weber, Z. ; Morkoç, H.
• X‐Ray Diffraction (XRD), Differential Thermal Analysis (DTA), and Scanning Electron Microscopy (SEM) of (CuInSe 2) 1— x (VSe) x Alloys (0 ≤ x ≤ 0.5)
  Grima Gallardo, P. ; Durán, S. ; Quintero, M. ; Muñoz, M. ; Delgado, G. ; Briceño, J.M. ; Romero, H. ; Ruiz, J.
• A Reinvestigation of the Structure and Torsional Potential of N 2 O 5 by Gas‐Phase Electron Diffraction Augmented by Ab Initio Theoretical Calculations
  McClelland, Bruce M. ; Richardson, Alan D. ; Hedberg, Kenneth
• AgGaSe 2 at High Pressure: Optical Absorption, Single Crystal X‐Ray Diffraction and Electronic Structure Calculations
  González, J. ; Power, Ch. ; Calderón, E. ; Capet, F. ; Muñoz, A.
• Evaluation of freeze substitution in rabbit skeletal muscle. Comparison of electron microscopy to X-ray diffraction
  Hawkins, Carolyn J. ; Bennett, Pauline M.
• Characterization of deformation structures in P-22 Cr–Mo steel through electron backscatter diffraction and transmission electron microscopy
  Bhattacharyya, Dhriti ; Drew, Michael ; Humphries, S. R. ; Payten, Warwick
• Distinct Conformations of Mirabegron Determined by MicroED
  Lin, Jieye ; Unge, Johan ; Gonen, Tamir
• Strain and relaxation in Si-MBE structures studied by reciprocal space mapping using high resolution X-ray diffraction
  Hansson, G. V. ; Radamsson, H. H. ; Ni, Wei-Xin
• Trifluormethylnitrat, CF 3 ONO 2
  Sander, S. ; Wullner, H. ; Oberhammer, H. ; Argüello, G. A.
• Packing Studies on Poly (di‐ n ‐alkylsilylenemethylene) s
  Park, Soo‐Young ; Interrante, Leonard V. ; Farmer, B. L.
• Strong Intramolecular Secondary Si⋅⋅⋅N Bonds in Trifluorosilylhydrazines
  Vojinović, Krunoslav ; McLachlan, Lorna J. ; Hinchley, Sarah L. ; Rankin, David W. H. ; Mitzel, Norbert W.
• Ultrafast Electron Crystallography: The Dawn of a New Era
  Thomas, John Meurig
• Ultrafast Electron Diffraction (UED) – A New Development for the 4D Determination of Transient Molecular Structures
  Srinivasan, Ramesh ; Lobastov, Vladimir A. ; Ruan, Chong‐Yu ; Zewail, Ahmed H.
• Bulk and Surface Electrical Properties of BiSb on Flat and Ion‐Beam Nano‐Patterned InP Substrates
  Elhoussieny, Ibrahim G. ; Rehaag, Thomas J. ; Bell, Gavin R.
• Quantification and Analysis of Niobium Carbide Precipitation in Cold‐Rolled High‐Strength Low‐Alloy Steel during Annealing Process
  An, Jeong Hun ; Lee, Changgeun ; Shin, Sang Hun ; Son, Ji Hee ; Na, Kwang Su