„Reliability engineering“

Suchergebnisse

10.000+ Treffer

• Production and Characterization of a Bone-Like Porous Ti/Ti-Hydroxyapatite Functionally Graded Material
  Yılmaz, Eren ; Kabataş, Feyza ; Gökçe, Azim ; Fındık, Fehim
• Effects of Yttrium on the Microstructure and Corrosion Behavior of Pb-39Mg-10Al-1B-Y Alloys
  Feng, Zhiqi ; Bao, Weizong ; Bao, Longke ; Peng, Mingjun ; Duan, Yonghua
• Improving the Strength of Friction-Stir-Welded Joints of AA1100 Alloy
  Senapati, N. Pallavi ; Bhoi, R. K.
• Comparative Analysis on the Wear Performance of New and Reconditioned Ceramic Cutting Tools When Machining Nodular Cast Iron GGG-60, with Lubrication of Two Types of Fluids
  Moreno, João Roberto Sartori ; Ribeiro, André Alonso ; Souza Gonçalves, Janaina Fracaro de
• Spatio-temporal prediction of missing temperature with stochastic Poisson equations – The LC2019 team winning entry for the EVA 2019 data competition
  Cheng, Dan ; Liu, Zishun
• Effects of Ce Addition on Mechanical and Corrosion Properties of the As-Extruded Mg-Zn-Ca Alloy
  Du, Yuzhou ; Liu, Dongjie ; Ge, Yanfeng
• Effectiveness and Reliability of Metal Diffusion Barriers for Copper Interconnects
  Bai, G. ; Wittenbrock, S. ; Ochoa, V. ; Villasol, R. ; Chiang, C. ; Marieb, T. ; Gardner, D. ; Mu, C. ; Fraser, D. ; Bohr, M.
• Incorporation of Nitrogen Atoms at Si/SiO2 Interfaces of Field Effect Transistors (FETs) to Improve Device Reliability
  Lucovsky, G. ; Lee, D.R ; Jing, Z. ; Whitten, J.L ; Parker, C. ; Hauser, J.R
• Accuracy and Reliability of Bulge Test Experiments
  Small, Martha K. ; Vlassak, Joost J. ; Powell, Stephen F. ; Daniels, Brian J. ; Nix, William D.
• Materials reliability issues with coaxial cable systems for the information superhighway
  Comizzoli, R. B. ; Crane, G. R. ; Fiorino, M. E. ; Frankenthal, R. P. ; Krautter, H. W. ; Peins, G. A. ; Siconolfi, D. J. ; Sinclair, J. D.
• Reliability analysis of Au–Sn flip-chip solder bump fabricated by co-electroplating
  Yoon, Jeong-Won ; Chun, Hyun-Suk ; Jung, Seung-Boo
• Gate dielectric reliability and instability in GaN metal-insulator-semiconductor high-electron-mobility transistors for power electronics
  Alamo, Jesús A. del ; Guo, Alex ; Warnock, Shireen
• The use of reliability factors in analyzing powder patterns in Pt–Si sputtering targets and subsequent films
  Rahman, Abdul ; Lowe, Walter P. ; Bates, Clayton W.
• Reliability of Ohmic Contacts for AlGaAs/GaAs HBTs
  Jackson, G. S. ; Tong, E. ; Saledas, P. ; Kazior, T. E. ; Sprague, R. ; Brooks, R. C. ; Hsieh, K. C.
• Pd-Ge-Au Ohmic Contacts to GaAs: Reliability and Failure Analysis
  Kazior, T. E. ; Hieslmair, H. ; Brooks, R. C.
• Reliability Characterization of Moisture-Induced Degradation of Low-K Dielectric Behavior for Advanced Interconnects
  Ionescu, A. M. ; Mondon, F. ; Blachier, D. ; Morand, Y. ; Reimbold, G.
• Calculation of Pore Size Distribution in the Ellipsometric Porosimetry: Method and Reliability
  Mogilnikov, K. P. ; Polovinkin, V. G. ; Dultsev, F. N. ; Baklanov, M. R.
• Reliability of Electrodeposited Copper and Ecrcvd Siof Films for Multilevel Metallization
  Lee, Seoghyeong ; Kim, Yong-An ; Lee, Kyoung-Woo ; Sohn, Seil ; Kim, Young-Il ; Yang, Sung-Hoon ; Oh, Kyunghui ; Park, Jong-Wan
• Low-Temperature Aging of Zirconia Ferrules Limits Optical-Connector Reliability
  Brinkman, Kyle
• A Practical Method for Rapid Assessment of Reliability in Deep Excavation Projects
  Arabaninezhad, Arefeh ; Fakher, Ali