„Reliability engineering“

Suchergebnisse

10.000+ Treffer

• Recent Reliability Progress of GaN HEMT Power Amplifiers
  Ohki, Toshihiro ; Kanamura, Masahito ; Kamada, Yoichi ; Makiyama, Kozo ; Inoue, Yusuke ; Okamoto, Naoya ; Imanishi, Kenji ; Joshin, Kazukiyo ; Kikkawa, Toshihide
• GaN HEMT Reliability: From Time Dependent Gate Degradation to On-state Failure Mechanisms
  Zanoni, Enrico ; Meneghesso, Gaudenzio ; Meneghini, Matteo ; Stocco, Antonio
• Determination of AlGaN/GaN HEMT Reliability Using Optical Pumping as a Characterization Method
  Cheney, D. ; Deist, R. ; Gila, B. ; Ren, F. ; Whiting, P. ; Navales, J. ; Douglas, E. ; Pearton, S.
• Design for Reliability and Common Failure Mechanisms in Vertical Cavity Surface Emitting Lasers
  Herrick, Robert W.
• Reliability Studies of Cu using Wafer Level Joule Heated Electromigration Test
  Low, Kia Seng ; O’Neill, Anthony
• Reliability of Long Pulsewidth High Power Laser Diode Arrays
  Meadows, Byron L. ; Amzajerdian, Farzin ; Barnes, Bruce W. ; Baker, Nathaniel R. ; Baggott, Rene P. ; Singh, Upendra N. ; Kavaya, Michael J.
• Nanoparticle Enhanced Solders for Increased Solder Reliability
  Mokhtari, Omid ; Roshanghias, Ali ; Ashayer, Roya ; Kotadia, Hiren R. ; Khomamizadeh, Farzad ; Kokabi, Amir H. ; Clode, Michael P. ; Miodownik, Mark ; Mannan, Samjid H.
• Reliability studies of pentacene based thin film transistors
  Ledru, R. ; Pleutin, S. ; Grouiez, B. ; Zander, D. ; Bejbouji, H. ; Lmimouni, K. ; Vuillaume, D.
• Probabilistic structural reliability analysis of a horizontal axis tidal turbine blade by considering the moisture effects on the blade material
  Attukur Nandagopal, Rajaram ; Narasimalu, Srikanth ; Chai, Gin Boay
• Enhanced Thermomechanical Properties of ZrO2 Particle Reinforced Epoxy Nanocomposite
  Kumar, Kaushal ; Ghosh, P. K. ; Kumar, Arun ; Singh, Ompal
• Method for Designing and Checking Tensile Coefficient in Ultra-Deep Wells Based on Casing Axial Load and Quality Reliability
  Lou, Erbiao ; Liu, Hongtao ; Sun, Tengfei ; Peng, Fen ; Zhang, Bo ; Zhou, Bo ; Zhang, Duanrui
• Reliability and Performance of Pseudomorphic Ultraviolet Light Emitting Diodes on Bulk Aluminum Nitride Substrates
  Grandusky, James R. ; Cui, Yongjie ; Mendrick, Mark C. ; Gibb, Shawn ; Schowalter, Leo J.
• Reliability of InP-based HBTs at High Current Density
  Fukai, Yoshino K.
• Gate Stack Reliability of high-Mobility 4H-SiC Lateral MOSFETs with Deposited AI2O3 Gate Dielectric
  Lichtenwalner, Daniel J. ; Misra, Veena ; Dhar, Sarit ; Ryu, Sei-Hyung ; Agarwal, Anant
• Comparative Study on Reliability of InP/InGaAs Heterojunction Bipolar Transistors with Highly Zn- and C-Doped Base Layers
  Koizumi, Atsushi ; Oshitanai, Kazuki ; Lee, Jaesung ; Uchida, Kazuo ; Nozaki, Shinji
• Reliability of GaN on Si FETs and MMICs
  Gajewski, Donald A. ; Nagy, Walter ; Hanson, Allen ; Johnson, Wayne ; Linthicum, Kevin
• The Effect of Passivation SiON layer on the Data Retention Reliability of NAND Flash Memory
  Jang, Younggeun ; Lee, Kwangwook ; Kim, Eunsoo ; Cho, Jonghye ; Shim, Jungmyoung ; Kim, Sangdeok ; Kim, Junggeun ; Park, Sangwook ; Lee, Byungseok ; Kim, Jinwoong
• Reliability in Mechatronics Systems from TEM, SEM and SE Material Analysis
  Dahoo, P. R. ; Alayli, N. ; Girard, A. ; Pougnet, P. ; Tan, K. L. ; Morelle, J. M.
• Reliability of High-Temperature Operation for GaN-Based Operational Amplifiers
  Nomoto, Kazuki ; Hasegawa, Kazuya ; Satoh, Masataka ; Nakamura, Tohru
• Vibrational Lifetimes of Hydrogen in Silicon: Isotope Effects and MOSFET Reliability
  Lüpke, Gunter ; Sun, Baozhou ; Tolk, Norman H. ; Feldman, Leonard C.