„Reliability engineering“

Suchergebnisse

10.000+ Treffer

• High-Current Reliability of Carbon Nanofibers for Interconnect Applications
  Kitsuki, Hirohiko ; Suzuki, Makoto ; Ngo, Quoc ; Gleasson, Kristofer ; Cassell, Alan M. ; Ominami, Yusuke ; Moylan, Christopher R. ; Li, Jun ; Yang, Cary Y.
• Lifeline Engineering Systems – Network Reliability Analysis and Aseismic Design
  2021 Springer Singapore
• Evaluating the Reliability of Predictions of First-Year Corrosion Losses of Structural Metals Calculated Using Dose-Response Functions for Territories with Different Categories of Atmospheric Corrosion Aggressiveness
  Panchenko, Yu. M. ; Marshakov, A. I. ; Nikolaeva, L. A. ; Igonin, T. N.
• Channel Reliability in MOSFETs with Gate Oxide Grown using ECR Plasma of O2/He
  Jaju, Vishwas ; Dalal, Vikram
• Reliability of Silicon Nitride Gate Dielectric in Vertical Thin-Film Transistors
  Moradi, Maryam ; Striakhilev, D. ; Chan, I. ; Nathan, A. ; Cho, N. I. ; Nam, H. G.
• Impact of Fabrication Process, Layout Variation and Packaging Process on Cu/Low-k Interconnect Reliability
  Karmarkar, Aditya ; Xu, Xiaopeng ; Pramanik, Dipu ; Lin, Xi-Wei ; Rollins, Greg ; Lin, Xiao
• Leakage Current and Reliability on Planar High-k Capacitor with Al2O3 Dielectric Deposited by Thermal-ALD
  Madassamy, S. ; Voiron, F. ; Nguyen, A. P. ; Lefèvre, A. ; Parat, G. ; Buttard, D. ; Sylvestre, A.
• Materials and scaling effects on on-chip interconnect reliability
  Hu, C.-K ; Liniger, E. G. ; Gignac, L. M. ; Bonilla, G. ; Edelstein, D.
• Package Reliability Analysis with Coupled Electro-Thermal and Mechanical Modeling
  Yun, Chan-Su ; Xu, Xiaopeng ; Terterian, Arsen ; Cilento, Tommaso
• Performance and Reliability of Thick Cu Interconnects for RF and Analog/Mixed Signal Technology
  Cooney, E. ; Gambino, J. P. ; Anderson, F. ; He, J. ; Lee, T. ; White, E. ; Liu, X. ; Cabral, C. ; Shaw, T.
• Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range
  Sriram, T. S. ; Strauss, B. ; Pappas, S. ; Baliga, A. ; Jean, A. ; Parodos, T. ; Dietz, D. ; Wang, P. ; Azimi, M. ; McCallion, K. ; Vakhshoori, D.
• Reliability and Stability of Novel Tunable Thin Film
  Lin, G. H. ; Fu, R. ; He, S. ; Sun, J. ; Zhang, X. ; Sengupta, L.
• The Mechanical Reliability of Sputter-Coated Indium Tin Oxide Polyester Substrates for Flexible Display and Touchscreen Applications
  Cairns, Darran R. ; Paine, David C. ; Crawford, Gregory P.
• Relationships Between Microstructure and Reliability in Pzt Mems
  Olson, B. W. ; Randall, L. M. ; Richards, C. D. ; Richards, R. F. ; Bahr, D. F.
• Comparative Study on Wafer-Level and Package-Level Electromigration Reliability for Sub-Quarter Micron Logic Devices
  Park, Young B. ; Lee, Duk W.
• System reliability analysis of seismic pseudo-static stability of rock wedge based on nonlinear Barton—Bandis criterion
  Zhao, Lian-heng ; Jiao, Kang-fu ; Li, De-jian ; Zuo, Shi
• Monotonic and cyclic mechanical reliability of metallization lines on polymer substrates
  Glushko, Oleksandr ; Klug, Andreas ; List-Kratochvil, Emil J. W. ; Cordill, Megan J.
• Through-silicon via stress characteristics and reliability impact on 3D integrated circuits
  Jiang, Tengfei ; Im, Jay ; Huang, Rui ; Ho, Paul S.
• Reliability of Dielectric Barrier Films in Copper Damascene Applications
  Lee, Albert S. ; Lakshmanan, Annamalai ; Rajagopalan, Nagarajan ; Cui, Zhenjiang ; Le, Maggie ; Xia, Li Qun ; Kim, Bok Heon ; M’Saad, Hichem
• Relationship Between Interfacial Adhesion and Dielectric Reliability of Cu Alloy Films
  Yi, Seol-Min ; Jang, Kwang-Ho ; Huh, Yong-Hak ; Park, Young-Bae ; Joo, Young-Chang