„Reliability engineering“

Suchergebnisse

10.000+ Treffer

• Effect of Precipitation Hardening on Corrosion Resistance of Cu-4.5 wt.%Ti
  Hanoz, Denise ; Settimi, Alessio Giorgio ; Pezzato, Luca ; Dabala, Manuele
• Electrochemical and Tribological Characteristics of CrN x Composition Gradient Coating in Aqueous Solution
  Zhou, Fei ; Fu, Yongqiang ; Wang, Qianzhi ; Kong, Jizhou
• Fabrication of Magnesium Phosphate Coating by Electrochemical Cathodic Method for Corrosion Protection of Sintered NdFeB Magnets
  Zhou, Qiongyu ; Liu, Songli
• Microstructure and Mechanical Properties of Hydrogenated Ti-0.3Mo-0.8Ni Alloy Gas Tungsten Arc Welding Joints
  Liu, Quanming ; Long, Weimin ; Fu, Li ; Zhang, Zhaohui ; Zhong, Sujuan ; Yang, Haiying
• Experimental Study on the Forming Limit of GH605 Superalloy Sheet Using Digital Image Correlation
  Wang, Yanju ; Sha, Aixue ; Li, Xingwu ; Jia, Chonglin ; Hao, Wenfeng
• The Influence of High Temperature Ultrasonic Processing Time on the Microstructure and Mechanical Properties AZ91E Magnesium Alloy
  Emadi, P. ; Ravindran, C.
• Joint reliability importance of weighted consecutive systems
  Kamalja, Kirtee K. ; Amrutkar, Kalpesh P.
• Electromigration Reliability in Nanoscale Cu Interconnects
  Hu, C.-K ; Gignac, L. M. ; Baker-O’Neal, B. C. ; Bonilla, G. ; Liniger, E. G. ; Flaitz, P. L.
• Experimental Analysis of Impact Resistance of 3D Polycarbonate and Nylon + Carbon Fiber Specimens
  García-León, R. A. ; Rodríguez-Castilla, M. ; Quintero-Quintero, W.
• Computer-aided gear product realization using enhanced decision-making in material selection and reliability assessment
  Yazdanshenas, Armin ; Yazdanshenas, Alireza ; Goh, Chung-Hyun
• Reliability optimization design of hydraulic system considering oil contamination
  Zhou, Xinda ; Yang, Zhaojun ; Tian, Hailong ; Chen, Chuanhai ; Wang, Liding ; Zhu, Yongfu ; Liu, Jia
• Effect of Metallic Contamination on Interface Properties and Oxide Reliability
  Oborina, Elena ; Campbell, Scott ; Hoff, Andrew M. ; Gilbert, Richard ; Persson, Eric ; Simpson, Darrell
• Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Trees
  Gan, C. L. ; Thompson, C. V. ; Pey, K. L. ; Choi, W. K. ; Wei, F. ; Yu, B. ; Hau-Riege, S. P.
• EBIC and XTEM Analysis of High Voltage SMOS Reliability Failures
  Rice, Larry
• Length Effects on the Reliability of Dual-Damascene Cu Interconnects
  Wei, F. ; Gan, C. L. ; Thompson, C. V. ; Clement, J. J. ; Hau-Riege, S. P. ; Pey, K. L. ; Choi, W. K. ; Tay, H. L. ; Yu, B. ; Radhakrishnan, M. K.
• Physical Mechanisms Affecting the Reliability of GaN-based High Electron Mobility Transistors
  Schrimpf, R. D. ; Fleetwood, D. M. ; Pantelides, S. T. ; Puzyrev, Y. S. ; Mukherjee, S. ; Reed, R. A. ; Speck, J. S. ; Mishra, U. K.
• Reliability Study of Organic Light-emitting Diodes by Continuous-wave and Pulsed Current Stressing
  Li, X. M. ; Acharya, R. ; Zhang, Y. Q. ; Cao, X. A.
• Reliability and Degradation Mechanisms in High Power Broad-Area InGaAs-AlGaAs Strained Quantum Well Lasers
  Sin, Yongkun ; Presser, Nathan ; LaLumondiere, Stephen ; Brodie, Miles ; Lingley, Zachary ; Ives, Neil ; Foran, Brendan ; Lotshaw, William ; Moss, Steven C.
• Reliability Detection of Process-Induced Metallization Defects in GaAs Devices
  Kilgore, Steve H.
• Reliability of MEMS Materials: Mechanical Characterization of Thin-Films using the Wafer Scale Bulge Test and Improved Microtensile Techniques
  Gaspar, Joao ; Schmidt, Marek ; Held, Jochen ; Paul, Oliver