„event processing“
Suchergebnisse
1.271 Treffer
-
Information Processing and Performance Research in Event-Driven Process Metodology (EPM) Notation
-
Event Processing for Business – Organizing the Real-Time Enterprise
-
Event Processing for Business – Organizing the Real-Time Enterprise
-
Transactions on Large-Scale Data- and Knowledge-Centered Systems XIV
-
Business Process Management Workshops – BPM 2013 International Workshops, Beijing, China, August 26, 2013, Revised Papers
-
A Reference Architecture for Real-Time Performance Measurement – An Approach to Monitor and Control Manufacturing Processes
-
Robust Subspace Estimation Using Low-Rank Optimization – Theory and Applications
-
Transactions on Large-Scale Data- and Knowledge-Centered Systems XI – Special Issue on Advanced Data Stream Management and Continuous Query Processing
-
The concept of a real-time enterprise in manufacturing – design and implementation of a framework based on EDA and CEP
-
Ordering events: Intervals are sufficient, more general sets are usually not necessary
-
Objects in Context – The Neurocognitive Representation, Binding, and Processing of Object and Context Features in Recognition Memory ; an Electrophysiological Approach
-
Objects in context – the neurocognitive representation, binding, and processing of object and context features in recognition memory ; an electrophysiological approach
-
Economic Assessment of Pig Meat Processing and Cutting Production by Simulation
-
Dynamic event-triggered adaptive tracking control of UMSVs with internal and external uncertainties
-
Intelligent Video Event Analysis and Understanding
-
$$H_{\infty }$$ H ∞ Control of Nonlinear Networked Cascade Control System under Multi-channel Quantization and Event-triggered Mechanism
-
Efficient rare event sampling with unsupervised normalizing flows
-
ECEQ: efficient multi-source contact event query processing for moving objects
-
A Markov regime-switching event response model: beef price spread response to processing capacity shocks
-
Synergistic effect of total ionizing dose and single event gate rupture in MOSFET with Si3N4–SiO2 stacked gate