„Electronic data processing“

Suchergebnisse

5.920 Treffer

• 3D Parallel Simulations of Fluctuation Effects in pHEMTs
  García-Loureiro, A.J ; Kalna, K. ; Asenov, A.
• Effect of Shape and Size on Electron Transition Energies for Nanoscale InAs/GaAs Quantum Rings
  Li, Yiming ; Lu, Hsiao-Mei
• Brownian Ionic Channel Simulation
  Millar, C. ; Asenov, A. ; Roy, S.
• Quantum Monte Carlo Device Simulation of Nano-Scaled SOI-MOSFETs
  Tsuchiya, Hideaki ; Horino, Motoki ; Miyoshi, Tanroku
• Negative Effective Mass Terahertz Range Oscillators on a Cleaved Edge of a Superlattice
  Gribnikov, Z.S ; Vagidov, N.Z ; Mitin, V.V
• Coupling Maxwell's Equations to Full Band Particle-Based Simulators
  Ayubi-Moak, J.S ; Goodnick, S.M ; Aboud, S.J ; Saraniti, M. ; El-Ghazaly, S.
• Comparison of Double-Gate MOSFETs and FinFETs with Monte Carlo Simulation
  Kathawala, Gulzar A. ; Mohamed, Mohamed ; Ravaioli, Umberto
• Quantum and Semi-Classical Transport in NEMO 1-D
  Klimeck, Gerhard
• Gauge-Invariant Formulation of Fermi's Golden Rule and Its Application to High-Field Transport in Semiconductors
  Ciancio, Emanuele ; Iotti, Rita C. ; Rossi, Fausto
• Fast Full-Band Device Simulator for Wurtzite and Zincblende GaN MESFET Using a Cellular Monte Carlo Method
  Yamakawa, Shinya ; Aboud, Shela ; Saraniti, Marco ; Goodnick, Stephen M.
• Degeneracy and High Doping Effects in Deep Sub-Micron Relaxed and Strained Si n-MOSFETs
  Watling, J.R ; Yang, L. ; Boriçi, M. ; Barker, J.R ; Asenov, A.
• High Electron Mobility Limited by Remote Impurity Scattering
  Hamaguchi, C.
• A Non Perturbative Model of Surface Roughness Scattering for Monte Carlo Simulation of Relaxed Silicon n-MOSFETs
  Boriçi, M. ; Watling, J.R ; Wilkins, R. ; Yang, L. ; Barker, J.R
• Terahertz Generation from Dynamic Free-Carrier Superlattice in n + nn + InN Structures
  Starikov, E. ; Shiktorov, P. ; Gruzinskis, V. ; Reggiani, L. ; Varani, L. ; Vaissière, J.C
• Green Function Simulation Study of Non Self-Averaging Scattering Processes in Atomistic Semiconductor Devices
  Barker, John R.
• The Density of States and the Pertinent Electronic Properties of the Quasi 2DEG in Simple and DMS Structures Subjected to an In-Plane Magnetic Field
  Simserides, Constantinos
• Monte Carlo Simulation of Electronic Noise in Semiconductor Materials and Devices Operating under Cyclostationary Conditions
  Shiktorov, P. ; Starikov, E. ; Gružinskis, V. ; Reggiani, L. ; Varani, L. ; Vaissière, J.C ; Pérez, S. ; González, T.
• Coulomb Blockade in Silicon Devices: Electronic Structure of Quantum Dots
  Sée, J. ; Dollfus, P. ; Galdin-Retailleau, S. ; Hesto, P.
• Simulation of Carrier Transport in p-Si/SiGe Quantum Cascade Emitters
  Ikonić, Z. ; Harrison, P. ; Kelsall, R.W
• Self-Consistent Subband Structure and Mobility of Two Dimensional Holes in Strained SiGe MOSFETs
  Krishnan, Santhosh ; Vasileska, Dragica