„Process Modeling“
Suchergebnisse
10.000+ Treffer
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Electron–phonon physics from first principles using the EPW code
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Anharmonic electron-phonon coupling in ultrasoft and locally disordered perovskites
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Author Correction: Anharmonic electron-phonon coupling in ultrasoft and locally disordered perovskites
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Assessment of Solar‐to‐Fuels Strategies: Photocatalysis and Electrocatalytic Reduction
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Species distribution modeling as an approach to studying the processes of landscape domestication in central southern Mexico
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Thermo-electro-mechanical modeling of spark plasma sintering processes accounting for grain boundary diffusion and surface diffusion
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Structural equation modeling-based performance estimation and parametric analysis of wire electrical discharge machining processes
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Modeling diffusion processes in the presence of a diffuse layer at charged mineral surfaces: a benchmark exercise
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Mathematical modeling of Czochralski type growth processes for semiconductor bulk single crystals
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Process Modeling and Simulation of the Radiation in the Electric Arc Furnace
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Multi-target prediction for dummies using two-branch neural networks
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Enterprise, business-process and information systems modeling – 14th international conference, BPMDS 2013, 18th international conference, EMMSAD 2013, held at CAiSE 2013, Valencia, Spain, June 17 - 18, 2013 ; proceedings
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Model predictive control for high-speed maglev vehicles: modeling, design, implementation, and simulation
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Diagnostische Urteile von Lehrkräften erklären – Ein Rahmenmodell für kognitive Modellierungen und deren experimentelle Prüfung
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Process Modeling and Control in Chemical Engineering.Herausgeg. K. Naijm. Marcel Dekker Inc., New York – Basel 1989. 520 S. zahlr. Abb. u. Tab., geb., $ 150,–.
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Modeling and Optimization of Fermentation Processes. Von B. Volesky und J. Votruba. Elsevier, Amsterdam 1992. 266 S., zahlr. Abb. und Tab., US‐$ 134,50.
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Book Review: Modeling Materials Processing. By Jonathan A. Dantzig, Charles L. Tucker III
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Outlier-detection for reactive machine learned potential energy surfaces
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Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
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An experimental survey of a posteriori Courant finite element error control for the Poisson equation