„electron diffraction“

Suchergebnisse

2.848 Treffer

• Neutron Diffraction Analysis of Internal Stresses and Microstructure – in Single and Two Phase Metals and Alloys
  Davydov, Vadim 2013 LAP LAMBERT Academic Publishing
• Uniting Electron Crystallography and Powder Diffraction
  2012 Springer Netherlands
• Quantitative SEM analysis of the evolution of microstructure in tempered martensite ferritic steels during creep and high temperature fracture
  Fahimi, Shirin 2016 Shaker Verlag
• Applied rheed – reflection high energy electron diffraction during crystal growth
  Braun, Wolfgang 1999 Springer
• Solar Energy Conversion via Low-Cost Nanostructured Thin Films – Cheap Renewable Energy from Sun and Water
  Hassan, Ibrahim A. I. 2012 LAP LAMBERT Academic Publishing
• EBSD-Image – An Open Source Engine for the Processing of Electron Backscatter Patterns
  Pinard, Philippe 2012 LAP LAMBERT Academic Publishing
• Transmission Electron Microscopy and Diffractometry of Materials
  Fultz, Brent ; Howe, James M. 2013 Springer Berlin Heidelberg
• X-ray Diffraction, Dielectric, and Raman Spectroscopy Studies of SrTiO3-Based Microwave Ceramics
  Qu, Jingjing ; Liu, Fei ; Wei, Xing ; Yuan, Changlai ; Liu, Xinyu ; Chen, Guohua ; Feng, Qin
• Limestone Waste Dust, PFA and APC Residues in Road Base Material – A Successful Application of Industrial Wastes in Road Pavement Structure
  Saghafi, Behrooz 2012 LAP LAMBERT Academic Publishing
• Non-destructive synchrotron X-ray diffraction mapping of a Roman painting
  Dooryhée, E. ; Anne, M. ; Bardiès, I. ; Hodeau, J.-L ; Martinetto, P. ; Rondot, S. ; Salomon, J. ; Vaughan, G.B.M ; Walter, P.
• Electron-Diffraction Analysis of Clay Mineral Structures
  1967 Springer US
• Electron back-scattered diffraction and nanoindentation analysis of nanostructured Al tubes processed by multipass tubular-channel angular pressing
  Mesbah, Mohsen ; Faraji, Ghader ; Bushroa, A. R.
• X-ray diffraction line profile analysis of KBr thin films
  Rai, R. ; Triloki, Triloki ; Singh, B. K.
• Characterization of Microstructures by Analytical Electron Microscopy (AEM)
  Rong, Yonghua 2012 Springer Berlin Heidelberg
• Transmission electron microscopy and diffractometry of materials
  Fultz, Brent ; Howe, James M. 2013 Springer
• Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction
  Aschentrup, A. ; Hachmann, W. ; Westerwalbesloh, T. ; Lim, Y.C ; Kleineberg, U. ; Heinzmann, U.
• Investigation of superstructures in mullite by high resolution electron microscopy and electron diffraction
  Ylä-Jääski, Juha Tuomo Tapio
• Fabrication of ordered arrays of silicon cones by optical diffraction in ultrafast laser etching with SF6
  Riedel, D. ; Hernandez-Pozos, J.L ; Palmer, R.E ; Kolasinski, K.W
• Fabricating high-aspect-ratio sub-diffraction-limit structures on silicon with two-photon photopolymerization and reactive ion etching
  Lee, C.-H ; Chang, T.-W ; Lee, K.-L ; Lin, J.-Y ; Wang, J.
• In situ accelerated leaching of cement paste by application of electrical fields monitored by synchrotron X-ray diffraction
  Castellote, M. ; Turrillas, X. ; Andrade, C. ; Alonso, C. ; Rodriguez, M.A ; Kvick