„electron diffraction“

Suchergebnisse

2.848 Treffer

• Solving unknown complex oxide structures by precession electron diffraction: AgCoO2, PbMnO2.75 and LiTi1.5Ni0.5O4
  Klein, H. ; Gemmi, M. ; Rageau, A.
• Reflection High Energy Electron Diffraction (RHEED) Study of Nanostructures: From Diffraction Patterns to Surface Pole Figures
  Tang, Fu ; Lu, Toh-Ming ; Wang, Gwo-Ching
• Structural Fingerprinting of Nanocrystals: Advantages of Precession Electron Diffraction, Automated Crystallite Orientation and Phase Maps
  Moeck, Peter ; Rouvimov, Sergei ; Rauch, Edgar F. ; Nicolopoulos, Stavros
• Automated diffraction tomography combined with electron precession: a new tool for ab initio nanostructure analysis
  Kolb, Ute ; Gorelik, Tatiana ; Mugnaioli, Enrico
• Structural Characterization of GA on Si(112) by Auger Electron Diffraction
  Yater, J. E. ; Shih, A. ; Idzerda, Y. U.
• X-Ray and Electron Diffraction Studies of As-Deposited Rf Sputtered Thin Films of IrO2
  Penfold, I. T. ; Moss, S. C. ; Kulik, J. ; Kreider, K. G.
• Transmission Electron Microscopy and X-ray Diffraction Investigation of the Microstructure of Nanoscale Multilayer TiAlN/VN Grown by Unbalanced Magnetron Deposition
  Luo, Q. ; Lewis, D. B. ; Hovsepian, P. Eh ; Münz, W.-D
• X-ray diffraction and transmission electron microscopy analysis of ordering and structure in Al1−xInxAs thin films
  Forrest, R. L. ; Kulik, J. ; Golding, T. D. ; Moss, S. C.
• Pyrocarbon anisotropy as measured by electron diffraction and polarized light
  Bourrat, Xavier ; Trouvat, Béatrice ; Limousin, Guillaume ; Vignoles, Gérard ; Doux, François
• Unipolar Cherenkov and Diffraction Radiation of Relativistic Electrons
  Naumenko, G. ; Shevelev, M. ; Popov, K. E.
• Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) Upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction
  Hanisch-Blicharski, Anja ; Krenzer, Boris ; Möllenbeck, Simone ; Ligges, Manuel ; Zhou, Ping ; Kammler, Martin ; Horn-von Hoegen, Michael
• Investigation of Aluminum Thin Films using Electron Backscatter Diffraction and the New Technique of Orientation Imaging Microscopy
  Dingley, D.J ; Field, D.P
• Characterization of ballistically deformed tungsten [100]-, [111]-, and [110]-oriented single crystal penetrators by optical metallography, x-ray diffraction and transmission electron microscopy
  Herring, R. A. ; Bruchey, W. J. Jr ; Kingman, P. W.
• X-Ray Diffraction and Scanning Electron Microscopy Studies of Molybdenum Trioxide Prepared by Thermal Oxidation of Electrodeposited Molybdenum Sulfide
  Bélanger, Daniel ; Laperriere, Guylaine ; Preda, Michel
• RDF Analysis of Ion-Amorphized SiO2 and SiC from Electron Diffraction using Post-Specimen Scanning in the Field-Emission Scanning Transmission Electron Microscope
  Bell, David C. ; Garratt-Reed, Anthony J. ; Hobbst, Linn W.
• Analysis and characterization by electron backscatter diffraction of microstructural evolution in the adiabatic shear bands in Fe-Cr-Ni alloys
  Yang, Huajie ; Xu, Yongbo ; Seki, Yasuaki ; Nesterenko, Vitali F. ; Meyers, Marc André
• Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps
  Winkelmann, A. ; Nolze, Gert ; Cios, G. ; Tokarski, T. ; Bala, P. 2020 Bundesanstalt für Materialforschung und -prüfung (BAM)
• Copper Oxide Films Grown by Atomic Layer Deposition from Bis(tri-n-butylphosphane)copper(I)acetylacetonate on Ta, TaN, Ru, and SiO2
  Waechtler, Thomas ; Oswald, Steffen ; Roth, Nina ; Jakob, Alexander ; Lang, Heinrich ; Ecke, Ramona ; Schulz, Stefan E. ; Gessner, Thomas ; Moskvinova, Anastasia ; Schulze, Steffen ; Hietschold, Michael 2009 Universitätsbibliothek Chemnitz
• Local strains measured in Al lines during thermal cycling and electromigration using convergent-beam electron diffraction
  Nucci, J. ; Kra¨mer, S. ; Arzt, E. ; Volkert, C. A.
• Tungsten Bronze Ferroelectric ceramics & Applications – Ferroelectric & Piezoelectric properties
  Vemuri, Raghavendra ; Suryanarayana, B. 2020 Scholars' Press