„electron diffraction“

Suchergebnisse

2.848 Treffer

• Structural study of the LaNi4.6Ge0.4-D2 system using X-ray and neutron powder diffraction
  Joubert, J.-M ; Latroche, M. ; Bowman Jr., R.C ; Percheron-Guégan, A. ; Bourée-Vigneron, F.
• Large angle convergent beam electron diffraction determinations of dislocation Burgers vectors in synthetic stishovite
  Cordier, P. ; Sharp, T. G.
• Structural evolution of a Ta-filament during hot-wire chemical vapour deposition of Silicon investigated by electron backscatter diffraction
  Oliphant, Clive J. ; Arendse, Christopher J. ; Prins, Sara N. ; Malgas, Gerald F. ; Knoesen, Dirk
• Investigation of a K-Bentonite by X-Ray Powder Diffraction and Analytical Transmission Electron Microscopy
  Huff, W. D. ; Whiteman, J. A. ; Curtis, C. D.
• Residual stress in sprayed Ni+5%Al coatings determined by neutron diffraction
  Matějíček, J. ; Sampath, S. ; Gnäupel-Herold, T. ; Prask, H.J
• Electron diffraction and microscopy of single-wall carbon nanotube bundles produced by different methods
  Colomer, J.-F ; Henrard, L. ; Lambin, Ph ; Van Tendeloo, G.
• Performance of an Indium-sealed S-band RF Photoelectron Gun for Time-resolved Electron Diffraction Experiments
  Kim, Hyun Woo ; Jang, Kyu-Ha ; Baek, In Hyung ; Lee, Kitae ; Jeong, Young Uk ; Nam, Jinhee ; Chae, Moonsik ; Kim, Mi Hye ; Kim, Young Chan ; Oang, Key Young ; Park, Sunjeong ; Han, Jang-Hui ; Vinokurov, Nikolay A.
• In situ protein micro-crystal fabrication by cryo-FIB for electron diffraction
  Li, Xinmei ; Zhang, Shuangbo ; Zhang, Jianguo ; Sun, Fei
• Neutron-diffraction study of stress-induced martensitic transformation in TRIP steel
  Oliver, E.C ; Withers, P.J ; Daymond, M.R ; Ueta, S. ; Mori, T.
• An electron diffraction study of the structure of the molecule of 1,12-dimethyl-1,12-dicarba-closo-dodecaborane(12) 1,12-C2(CH3)2B10H10 in the gaseous phase
  Mastryukov, V. S. ; Atavin, E. G. ; Golubinskii, A. V. ; Vilkov, L. V. ; Stanko, V. I. ; Gol'tyapin, Yu. V.
• X-ray Diffraction Residual Stress Measurement at Room Temperature and 77 K in a Microelectronic Multi-layered Single-Crystal Structure Used for Infrared Detection
  Lebaudy, A.-L ; Pesci, R. ; Fendler, M.
• Optical diffraction radiation from a dielectric and a metal nanowire excited by a modulated electron beam
  Yevtushenko, Dariia O. ; Dukhopelnykov, Sergii V. ; Nosich, Alexander. I.
• Electron diffraction study of the short-range order in amorphous Yb1 − x Sm x As4Se7 films
  Hajiev, E. Sh ; Madadzade, A. I. ; Ismailov, D. I.
• Characterization of vacancy-related defects introduced into silicon during heat treatment by deep-level transient spectroscopy and gamma-ray diffraction techniques
  Sobolev, N. A. ; Shek, E. I. ; Kurbakov, A. I. ; Rubinova, E. E. ; Sokolov, A. E.
• Electron paths, tunnelling, and diffraction in the spacetime algebra
  Gull, Stephen ; Lasenby, Anthony ; Doran, Chris
• Characterization of Soil Clay Minerals: Decomposition of X-Ray Diffraction Diagrams and High-Resolution Electron Microscopy
  Righi, Dominique ; Elsass, Françoise
• Unsupervised machine learning applied to scanning precession electron diffraction data
  Martineau, Ben H. ; Johnstone, Duncan N. ; Helvoort, Antonius T. J. van ; Midgley, Paul A. ; Eggeman, Alexander S.
• Quantitative analysis of grain size in bimodal powders by x-ray diffraction and transmission electron microscopy
  He, J. ; Ye, J. ; Lavernia, E. J. ; Matejczyk, D. ; Bampton, C. ; Schoenung, J. M.
• Use of Reciprocal Lattice Layer Spacing in Convergent Beam Electron Diffraction Analysis
  Raghavan, M. ; Scanlon, J. C. ; Steeds, J. W.
• Modification of Graphene on a Copper Grid during Femtosecond Laser Irradiation: Electron Diffraction and Raman Spectroscopy Studies
  Mironov, B. N. ; Aseev, S. A. ; Sokolik, A. A. ; Mavrin, B. N. ; Timofeev, A. A. ; Ishchenko, A. A. ; Kochikov, I. V. ; Chekalin, S. V. ; Ryabov, E. A.