„Thread“
Suchergebnisse
2.888 Treffer
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Infusion of Nanotechnology in Chemistry Courses Through Laboratory Redesign and Vertical Threads
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Naphthalene diimide bis-guanidinio-carbonyl-pyrrole as a pH-switchable threading DNA intercalator
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Mechanism for the Reduction of Threading Dislocation Densities in Si0.82Ge0.18 Films on Silicon on Insulator Substrates
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Growth defects in GaN films on sapphire: The probable origin of threading dislocations
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Large-Scale Vortex Motion and Multiple Plasmoid Ejection Due to Twisting Prominence Threads and Associated Reconnection
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DIN EN ISO 6149-1, Leitungsanschlüsse für Fluidtechnik und allgemeine Anwendung - Einschraublöcher und Einschraubzapfen mit metrischem Gewinde nach ISO 261 und O-Ring-Abdichtung. Teil 1, Einschraublöcher mit Ansenkung für O-Ring-Abdichtung (ISO 6149-1:2019) – = Connections for hydraulic fluid power and general use - ports and stud ends with ISO 261 metric threads and O-ring sealing. Part 1, Ports with truncated housing for O-ring seal (ISO 6149-1:2019)
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Theory of Electron Energy Loss Spectroscopy and its Application to Threading Edge Dislocations in GaN
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Double pendeo-epitaxial growth of GaN films with low density of threading dislocation
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Reduction of Threading Dislocations in GaN grown on 'c' plane sapphire by Movpe
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In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films
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Direct Observation of Stacking Fault Nucleation from Deflected Threading Dislocations with Burgers Vector c+a in PVT Grown 4H-SiC
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Conversion of Basal Plane Dislocations to Threading Edge Dislocations by High Temperature Annealing of 4H-SiC Epilayers
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Simulation of Grazing-Incidence Synchrotron X-ray Topographic Images of Threading c+a Dislocations in 4H-SiC
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The occupancy of the threading dislocation lines within n-type gallium nitride: Recent progress
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The Influence of Substrate Patterning on Threading Dislocation Density and Residual Stress in GaAs/Si Heteroepitaxial Layers
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Confinement of Threading Dislocations in SIMOX with A GeSi Strained Layer
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Threading dislocations with edge components in GaN epilayers grown on Al2O3 substrates
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Drastic Reduction of Threading Dislocation Density of AlGaN on SiC Wafer by Using Highly-Si-Incorporated AlGaN Superlattice
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Electronic Structure of GaN Quantum Dots with an Adjacent Threading Dislocation
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TEM Analysis of Threading Dislocations in ELO-GaN Grown with Controlled Facet Planes