„electron diffraction“

Suchergebnisse

2.848 Treffer

• Interfacial Characteristics and Optical Properties of InAs/InAsSb Type II Superlattices for the Mid‐Infrared Operation
  Liu, Mengying ; Shi, Chao ; Li, Weijie ; Nan, Pengfei ; Fang, Xuan ; Ge, Binghui ; Xu, Zhi ; Wang, Dengkui ; Fang, Dan ; Wang, Xiaohua ; Li, Jiaming ; Zeng, Liuqin ; Du, Peng ; Li, Jinhua
• Na 3 (BN 2) and Na 2 K (BN 2): A Known and a Novel Alkali Metal Dinitridoborate Obtained via Mild Thermal Dehydrogenation
  Koz, Cevriye ; Acar, Selçuk ; Prots, Yurii ; Höhn, Peter ; Somer, Mehmet
• Strain-induced structural and electronic phase transitions in ZrSe2: high pressure X-ray diffraction and Raman studies
  Ghosh, Bishnupada ; Sahu, Mrinmay ; Samanta, Debabrata ; Mukherjee, Goutam Dev
• Evidence of Intracrystalline Mesostructured Porosity in Zeolites by Advanced Gas Sorption, Electron Tomography and Rotation Electron Diffraction
  Garcia‐Martinez, Javier ; Xiao, Changhong ; Cychosz, Katie A. ; Li, Kunhao ; Wan, Wei ; Zou, Xiaodong ; Thommes, Matthias
• Evidences of Intracrystalline Mesostructured Porosity in Zeolites by Advanced Gas Sorption, Electron Tomography and Rotation Electron Diffraction
  Garcia‐Martinez, Javier ; Xiao, Changhong ; Cychosz, Katie A. ; Li, Kunhao ; Wan, Wei ; Zou, Xiaodong ; Thommes, Matthias
• Chemistry Modification of PMMA‐g‐PEG copolymer
  Rosa, Juliana dos Santos ; Silveira, Benila Maria ; Novack, Kátia Monteiro ; dos Santos, Viviane Martins Rebello ; de Moraes Teixeira, Leonardo César
• Corrosion resistance of extruded Mg–3Al–1Zn alloy manufactured by adding CaO for the replacement of the protective gases
  Nam, T.‐H. ; Kim, S.‐H. ; Kim, J.‐G. ; Kim, S.‐K.
• Properties of the new electronic device material La G dO 3
  Pavunny, Shojan P. ; Kumar, Ashok ; Misra, Pankaj ; Scott, James F. ; Katiyar, Ram S.
• Calculation of effective Young's modulus distribution from electron backscatter diffraction results for stochastic analyses in aerospace applications
  Dresbach, C. ; Dressler, U. ; Gussone, J. ; Reh, S.
• Intensity–voltage low‐energy electron microscopy for functional materials characterization
  Flege, Jan Ingo ; Krasovskii, Eugene E.
• Interaction Study of Yttria‐Based Glasses with High‐Temperature Electrolyte for SOFC
  Kumar, V. ; Pandey, O. P. ; Singh, K. ; Lu, K.
• An Anomalous Electron Configuration Among 3 d Transition Metal Atoms
  Tang, Zhexin ; Shang, Tongtong ; Xu, Han ; Lin, Ting ; Gao, Ang ; Lin, Weiguang ; Li, Xinyan ; Wang, Shiyu ; Yu, Botao ; Meng, Fanqi ; Zhang, Qinghua ; Wang, Xuefeng ; Su, Dong ; Meng, Qingbo ; Wu, Lijun ; Gu, Lin ; Nan, Ce‐Wen
• An Anomalous Electron Configuration Among 3 d Transition Metal Atoms
  Tang, Zhexin ; Shang, Tongtong ; Xu, Han ; Lin, Ting ; Gao, Ang ; Lin, Weiguang ; Li, Xinyan ; Wang, Shiyu ; Yu, Botao ; Meng, Fanqi ; Zhang, Qinghua ; Wang, Xuefeng ; Su, Dong ; Meng, Qingbo ; Wu, Lijun ; Gu, Lin ; Nan, Ce‐Wen
• Synchrotron Powder Diffraction at P02.1 at PETRA III: From Electron Density Distributions to in situ Total Scattering
  Dippel, Ann‐Christin ; Bindzus, Niels ; Saha, Dipankar ; Delitz, Jan Torben ; Liermann, Hanns‐Peter ; Wahlberg, Nanna ; Becker, Jacob ; Bøjesen, Espen D. ; Brummerstedt Iversen, Bo
• Synthesis and Crystal Structure of InFeO 3 (ZnO) 4 † ‡
  Erichsen, Svante Carl v. ; Assenmacher, Wilfried ; Schnakenburg, Gregor ; Mader, Werner
• Resolution of a bent‐crystal spectrometer for X‐ray free‐electron laser pulses: diamond versus silicon
  Kaganer, Vladimir M. ; Petrov, Ilia ; Samoylova, Liubov ; Petrov, Ilia; 2European XFEL GmbHHolzkoppel 4. Schenefeld 22869 Germany ; Samoylova, Liubov; 2European XFEL GmbHHolzkoppel 4. Schenefeld 22869 Germany 2021 International Union of Crystallography
• Relativistic correction of atomic scattering factors for high-energy electron diffraction
  Lentzen, Markus
• X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses
  Kaganer, Vladimir M. ; Petrov, Ilia ; Samoylova, Liubov
• Novel experimental setup for megahertz X‐ray diffraction in a diamond anvil cell at the High Energy Density (HED) instrument of the European X‐ray Free‐Electron Laser (EuXFEL)
  Liermann, H. P. ; Konôpková, Z. ; Appel, K. ; Prescher, C. ; Schropp, A. ; Cerantola, V. ; Husband, R. J. ; McHardy, J. D. ; McMahon, M. I. ; McWilliams, R. S. 2021 International Union of Crystallography
• Determination of Absolute Configurations of Bedaquiline Analogs by Quantum Chemical Electronic Circular Dichroism Calculations and an X‐ray Diffraction Study
  Wang, Zhiqiang ; Zhao, Lixia ; Chen, Yu ; Xu, Wei ; Sun, Tiemin